Optical Metrology Facility

Optical metrology is a broad, enabling technology spanning large machine vision systems used for on-line inspection of manufactured parts and the determination and characterization of physical features at the micron and sub-micron level. UNC Charlotte already operates the leading university precision metrology laboratory in the United States and one of the leading laboratories in the entire world. This facility will significantly extend those capabilities. Optical metrology will continue to enable advances in communication, electro-optics, and information technology as well as increase the quality and capability of more familiar products like automobiles and aircraft. The Optical Metrology Facility will include the following instrumentation together with supporting database systems: scanned probe microscope system, AFMs, scanning near-field microscope, scanning laser confocal microscope, scanning electron microscope, and x-ray interferometer test stand.